(AGENPARL) – GAITHERSBURG (MD) ven 14 aprile 2023 Researchers at the National Institute of Standards and Technology (NIST) and their colleagues have developed a novel tabletop device that takes three-dimensional X-ray (CT) images of integrated circuits. The highly detailed scans produced by the
Fonte/Source: https://www.nist.gov/news-events/news/nist-scientists-develop-novel-ct-scan-device-integrated-circuits